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Five Years of Live Chemical Imaging: From the First Live Maps to Real-time Dynamic Imaging Combining Morphology and Chemistry with Overlap Corrected EDS Data
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 516-517
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- August 2022
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Dynamic Electron and X-ray Imaging is a Moving Experience
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1840-1841
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- August 2021
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Use of spectrum simulation to optimise collection parameters for accurate and efficient WDS and EDS quantitative analyses
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1102-1104
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- August 2021
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Practical Aspects for Reliable Standardless Quantification in Energy Dispersive X-ray Spectrometry
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1554-1556
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- August 2020
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X-ray Spectrum Imaging at High Resolution in the STEM and STEM/SEM and SEM
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 656-657
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- August 2018
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X-ray Microanalysis at High Count Rate with Latest Generation Silicon Drift Energy Dispersive Spectrometer
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 724-725
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- August 2018
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Joy of Scanning with Electron and X-ray Imaging
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 624-625
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- August 2018
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Windowless EDS Detection of N Lines and their Practical use in sub 2 kV X-ray mapping to Optimize Spatial Resolution
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 112-113
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- July 2016
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Enhancing Materials and Device Analysis Capability in the SEM and FIB-SEM by using a Nanomanipulator
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 16-17
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- July 2016
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In-Situ Quantification of TEM Lamella Thickness and Ga Implantation in the FIB
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 342-343
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- August 2014
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New Large Area Silicon Drift Detectors - Fast Analysis without Compromise
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- Microscopy Today / Volume 17 / Issue 1 / January 2009
- Published online by Cambridge University Press:
- 14 March 2018, pp. 6-11
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- January 2009
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The Determination of the Efficiency of Energy Dispersive X-Ray Spectrometers by a New Reference Material
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- Microscopy and Microanalysis / Volume 12 / Issue 5 / October 2006
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- 19 September 2006, pp. 406-415
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- October 2006
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Practical Issues for Quantitative X-ray Microanalysis in SEM at Low kV
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- Microscopy Today / Volume 14 / Issue 1 / January 2006
- Published online by Cambridge University Press:
- 14 March 2018, pp. 30-33
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- January 2006
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Spectrum Imaging and Automation for Comprehensive Specimen Surveys
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1026-1027
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- August 2004
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Consistency Checks for X-Ray Microanalysis at Low KV
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 712-713
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- August 2001
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Improved X-ray Spectrum Simulation for Electron Microprobe Analysis
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- Microscopy and Microanalysis / Volume 7 / Issue 4 / July 2001
- Published online by Cambridge University Press:
- 02 February 2002, pp. 341-355
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- July 2001
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Compositional Phase Mapping using True Colour X-Ray Imaging
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 626-627
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- August 1999
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Measuring Performance of Energy-Dispersive X-ray Systems
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- Microscopy and Microanalysis / Volume 4 / Issue 6 / December 1998
- Published online by Cambridge University Press:
- 28 July 2005, pp. 605-615
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- December 1998
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Measuring Performance of EDX Systems
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 210-211
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- July 1998
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True Colour SEM Imaging for Phase Recognition AMD X-Ray Microanalysis
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- Microscopy Today / Volume 5 / Issue 3 / April 1997
- Published online by Cambridge University Press:
- 14 March 2018, pp. 8-18
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- April 1997
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